摘要：针对双目视觉测量系统存在误差因素繁多、分析困难等问题，提出了一种基于灰色关联技术的误差分析方法。
Abstract: According to the excessive error factors and difficult analysis of the binocular vision measurement systems, an error analysis method based on grey incidence technology was proposed.
提出了一种新的基于双目视觉和灰度差分的粒径测量方法，并开发了相应的查询系统。
A new particle size measurement technique based on the binocular vision and the particle image gray difference was suggested and a corresponding inquiry system was developed.
本文提出的结构光面扫描三维测量系统是基于机器视觉光栅编码原理的结构光扫描双目视觉测量技术。
The structure light 3-d measurement system is based on the structure light scanning binocular vision measurement of machine vision diffraction grating code principle technology.
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