利用X射线双晶衍射分析了晶体的完整性。
The lattice perfection of the InAs single crystal is studied with X-ray diffraction.
从双晶衍射半峰宽值可以评估硅片的抗弯强度。
By the halfwidth of rocking curve we can estimate the bending stress of silicon wafer.
双晶衍射仪的分辨本领高，测量范围小，最适合作小角散射测量。
Double crystal diffractometer applied to measure SAXS is very satisfactory, since it has high resolving power and relatively small measure area.
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