...分析和质子显微镜》任炽刚1981 1981版版 课程安排 课程安排 综述 综述 卢瑟福背散射分析( 卢瑟福背散射分析(RBS RBS)、 )、弹性反冲分 弹性反冲分 析( 析(ERD ERD))和沟道技术 和沟道技术 粒子诱发 粒子诱发XX射线荧光分析( 射线荧光分析...
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对卢瑟福背散射分析的基本原理作了概要的介绍。
The essential principle of Rutherford backscattering analysis is explained briefly.
卢瑟福背散射分析结果表明,铁、氮两种原子的密度沿膜厚度方向呈梯度变化。
Rutherford backscattering spectrometry (RBS) demonstrates that the concentration of Fe or N atoms varies gradually from the substrate to the surface through the whole thickness of the films.
离子注入后进行了氧化试验,并结合X射线衍射和卢瑟福背散射进行了分析。
X ray diffraction and Rutherford Back Scattering techniques were adopted to investigate and analyze the oxidation characteristics of the films.
And, in fact there's a technique of analysis used today that's called Rutherford back scattering where people actually saw that this is a means of identifying the substance, the sample.
事实上这是现在用的一种分析技术,称作卢瑟福背散射,就是人们实际上看到的那样,这是鉴别物质样品的一种方法。
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