分片实验与有限元法的论文_材料工程论文_中国论文网 关键词： 分片试验，弱形式，网线函数，有限元法 [gap=6312]key words: patch test, weak form, string-net function, finite element method
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芯片分离试验 die push test
威斯康星卡片分类试验 WCST ; Wisconsin Card Sorting Test
卡片分类试验 Wisconsin Card Sorting Test ; WCST
数值结果表明该单元能通过常曲率分片试验，收敛稳定并具有较好的精度。
Numerical results of typical problems show that it passes the constant curvature patch test and possesses stable convergence and high accuracy.
从而其分片试验、收敛性等性质也同时移植到板弯曲元，使两者处于同一水平上。
Therefore the theories such as patch test and FE convergence etc. can be moved to plate bending, thus both sides will be on the same theoretical level.
通过分片试验和悬臂梁等算例验证蒙特卡罗方法解决这些误差的可行性和有效性。
Finally, the numerical example of the patch experiment and the cantilever beam confirmed the validity and feasibility of using Monte Carlo integration to solve these errors.
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