与此同时，片上系统的测试问题也随之产生，基于边界扫描的内建自测试技术为片上系统的测试提供了新的解决方案。
Meanwhile the testing of SOC become more difficult and complex, Boundary-Scan-based Built-in-Test technology give a new solution.
本文在对目前主要的可测性设计方法进行研究的基础上，根据所设计CPU的结构特点，采用了边界扫描技术和基于BILBO的内建自测试技术结合的可测性设计方案。
Based on the research of primary DFT method and the structure characteristic of designed CPU, the article combines the boundary scan and Build-In Self-Test based on BILBO to test.
内建自测试(BIST)是一种有效降低测试开销的技术，在瞬态电流测试中得到了应用。
BIST has been applied into transient current testing as an effective method to reduce testing spending.
应用推荐