本文针对微处理器的特点，提出了指令级全速电流测试方法。
In this paper we have proposed instruction level At-speed current testing method taking both the characteristics of microprocessor and At-speed current testing into account.
结合故障精简，本文通过编码压缩、变化终止规则等方法进一步优化了全速电流测试方法的测试产生算法。
Besides fault collapsing, this paper also proposes some techniques, such as code collapsing, change of the ending rules to optimizing the test generation algorithm.
本文首先分析了稳态电流测试方法和瞬态电流测试方法的原理、特点，并分别指出它们的不足，在此基础上研究了一种新型的测试方法——全速电流测试方法。
This paper presents a new test method-at-speed current testing based on analyzing the theories, characteristics and shortcomings of quiescent power supply current testing and dynamic current testing.
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