Three sharp lines at 478^ 483.3 and 486.1nm respectively were observed for the first time in the as-irradiated samples and argued to be due to vacancy-like induced by irradiation.
对经辐照后未退火的N型样品的低温光致发光实验中,首次观察到三条尖锐的谱线,分别位于478.6、483.3和486.1nm位置,该系列谱线可能与辐照诱生的点缺陷有关。
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