介绍了一个设计性实验—利用反射式光强位移传感器工作特性曲线上升沿的线性区测量纸张厚度。
The thickness of paper is measured using the linear area of the characteristic curve of an optic-filter sensor.
本系统除可用于码盘的安装调试外，还可测量物体微位移、物体表面形貌及物体厚度，有很大的实用价值。
The system can be used in installing and debugging the disc and also in measuring the micro displacement of the object, the surface shape and thickness of the object, so it has fairly applied value.
德国米铱公司提供的电容式位移传感器被用于以纳米级的精度校准芯片光刻机中镜片的位置，测量晶圆厚度等应用。
Capacitive sensors from Micro-Epsilon are used, among other things, for the positioning, displacement measurement and thickness measurement in the semiconductors area.
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