The samples were characterized by field-emission scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy(EDS) and photoluminescence (PL).
通过扫描电子显微镜（SEM）、能谱分析仪（EDS）和光致发光（PL）测试对样品进行了表征。
The obtained products were characterized by powder X-ray diffraction (XRD), scanning electron microscopy (SEM), and field-emission scanning electron microscopy (FE-SEM).
利用粉末X射线衍射（XRD）、扫描电镜（SEM）和场发射扫描电镜（FE-SEM）对所得产物进行表征。
Field emission scanning electron microscopy images show that the SiC flower-like structures deposited by irregular hexagon.
场发射扫描电镜照片显示碳化硅主要有不规则的六角片堆积而成花状结构。
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