Embedded Memories and Logic Libraries 嵌入式内存和逻辑库
With a very small extra number of circuits, the testability problem was removed which is caused by the asynchronous clocks and embedded memories.
通过增加少许电路结构,解决了由于内部多时钟以及多个嵌入式存储器模块的结构带来的影响可测性要求的问题。
My knowledge, skills and memories are embedded in a vast pattern of neurotransmitter concentrations and interneuronal connections and cannot be quickly accessed or transmitted.
我的知识、技能和记忆根植在由神经递质集中和神经元间的连接组成的宽广支架上,不能够被迅速取得或传送。
A large number of various embedded memory are integrated in digital chips, as the constraints of chip ports, direct test of these memories is very difficult.
各种类型的嵌入式存储器大量集成于数字芯片中,由于芯片端口的限制,直接测试这些存储器非常困难。
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