An electronic analog model to simulate the properties of Josephson tunnel junction is described in this paper.
本文考虑了各项隧道电流,以一个相位锁定环路模拟约瑟夫逊隧道结。
As a result, in the electronic device, junction reliability can be improved.
由此,在电子设备中,能够提高接合的可靠性。
Index of electronic microscopy included microvilli, tight junction and cell space.
电镜观察指标为微绒毛、紧密连接及细胞间隙。
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