auger electron spectroscopy 俄歇电子能谱学 ; 俄歇电子能谱法
Auger Electron 俄歇电子
Auger electron spectrometer 俄歇电子能谱仪 ; 欧杰电子能谱仪
Auger electron image 俄歇电子象
auger electron emission 俄歇电子发射
scanning Auger electron microscope 扫描型奥格电子显微镜
Auger electron spectrum Auger能谱 ; 俄歇电子能谱 ; 俄歇谱
scanning Auger electron spectrometer 扫描欧杰电子能谱仪
Auger electron appearance spectroscopy 奥格电子出现电位光谱学
The structure and chemical compositions of the surface oxide film were investigated by XRD and Auger electron spectrometry (AES).
利用X射线衍射(XRD)和俄歇电子衍射(AES)观察了表面膜的化学成分及结构。
Auger electron Spectrscopy (AES) has widespread use in determining the chemical and electronic structure of solid surface (40a).
俄歇电子谱仪广泛地利用来确定固体表面的化学和电子结构(40 A)。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
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