...化试验 电迁移 可靠性 [gap=1198]Keywords : NiCr thin film resistor;low frequency noise;ageing test;electro migration;eliability ...
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... 复合逻辑电路(Compound Logic Gate) 电子移转现象(Electro Migration) 沟道电阻(Channel Resistance) ...
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IR-drop and electro migration can also reduce the chip performance and even make the chip out of work.
另外,直流电压降和电迁移也会引起芯片性能的降低,甚至导致芯片失效。
参考来源 - 深亚微米IC物理设计中的信号完整性研究·2,447,543篇论文数据,部分数据来源于NoteExpress
以上来源于: WordNet
There are solvent extraction, ion exchange, vacuum melting, vacuum distillation or sublimation, electro migration and regional melting, etc.
主要有溶剂萃取、离子交换、真空熔融、真空蒸馏或升华、电迁移以及区域熔炼等。
There are three physical effects on the power grid. Among them, IR-Drop effect and ground bounce effect impact the signal integrity while electro-migration impacts the reliability of VLSI design.
电源网格上存在着三种主要的物理效应,其中压降效应和地弹反射效应影响信号的完整性,电子迁移效应影响芯片设计的可靠性。
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