Analysis is made on the dark lines defects occurring over the working surface of flange by measurement with the optical microscope, Scanning electro microscope (SEM) and electronic probe.
针对法兰盘加工面上出现的黑纹缺陷，采用光学显微镜、扫描电镜和电子探针等测试方法对其进行了分析。
To observe the change of brain tissue and ultrastructure by fluorescence microscope with Evans Blue (EB) dyeing, electro-microscope with La footprint and transmission electro-microscope.
采用荧光显微镜伊文氏蓝(EB)、电镜镧示踪法以及透射电镜观察脑组织的超微结构变化。
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