Atomic absorption spectrometry (AAS), scanning electron microscopy (SEM), and energy dispersive X-ray spectrometry (EDXS) are carried out to characterize the deposition on fiber probe.
通过使用原子吸收光谱仪，扫描显微镜和能量色散X射线谱仪对覆膜光纤探针进行表征。
Then, the effects of heat treatment and temperature on the chemical composition and sheet resistance of the prepared films were investigated by XRD, EDXS and sheet resistance measurements.
利用X射线衍射和能量散射X射线能谱表征方法，并结合薄膜方块电阻的测定，探讨了热处理方式和热处理温度对薄膜化学组成及薄膜电阻的影响。
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