During an ESD event, both D1 and D2 can conduct, but the voltage at VIN exceeds the power-supply-rail voltage by only two forward-biased diode voltage drops.
在ESD事件中，D1和D2可以进行传导，但通过两个前置偏移二极管压降，VIN端的电压超出供电电源电压。
To design and manufacture a constant-source with adjustable amplitude value and the test system, and to realize the examination of zener diode voltage drift parameter, is very important.
设计制作出一个幅值可调的恒流源及其测试系统，实现稳压二极管电压漂移参数的检测，至关重要。
The Source-Measure Unit can also test other diode parameters, including forward voltage drop and breakdown voltage.
源-测量单元还可以测量其它的二极管参数，包括正向电压降和击穿电压。
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