... 衍射光谱计 diffraction spectrometer 衍射光谱法 diffraction spectroscopy 衍射光谱 绕射光谱 绕射频谱 diffractionspectrum ...
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low-energy electron diffraction spectroscopy 低能电子衍射光谱学
x-ray diffraction spectroscopy x射线衍射光谱
spectroscopy by diffraction grating [光] 衍射光栅光谱学
The structure and grain size were established by X-ray diffraction spectroscopy, differential thermal analysis and electron microscope. The application of product was probed also.
用x -射线衍射分析、差热分析、电镜等方法确定了其结构和粒度，并对产品的应用进行了初步探讨。
X-ray diffraction (XRD), atomic forced microscopy (AFM) and electronic diffraction spectroscopy (EDS) were respectively used to measure the morphologies, phase structures and composition.
通过X射线衍射（XRD）、原子力显微镜（AFM）、电子衍射能谱（EDS）等手段对薄膜进行了相的形成、结构特性及薄膜组成等的测试。
The properties of the product were characterized by thermogravimetry-differential thermal analysis, X-ray diffraction and Fourier infrared transmission spectroscopy.
用差热-热重分析、X射线衍射、红外光谱等手段对样品进行表征。
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