X-ray diffraction profile X射线衍射线形
x ray diffraction profile x射线衍射形貌
X-ray diffraction profile Fourier analysis X射线傅氏线形分析
x-ray diffraction profile analysis x射线衍射线形分析
x ray diffraction line profile x射线线形
x-ray diffraction line profile x射线衍射线形
x-ray diffraction line-profile x射线衍射轮廓
This paper deals with X-ray diffraction profile analysis for the sample with a micro-strain gradient in its surface layer.
本文讨论了样品表面层有微观应变梯度时X射线衍射线形分析的方法。
The refinement of crystal structure by the powder diffraction profile fitting method is reviewed on the basis of the relevant in the literature.
本文根据文献的有关资料，综述了粉末衍射图形拟合修正晶体结构的方法。
The common background method dealing with the background of diffraction profile was presented to increase the efficiency of X-ray stress measurement.
为了提高X射线应力分析的效率，提出了公用背底法对衍射线进行背底扣除。
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