electron device reliability 电子器件可靠性
microcavity device reliability 微腔器件可靠性
VDSM MOSFET device reliability 超深亚微米MOSFET可靠性
homing device operational reliability 自导装置操作可靠性
Reliability of Electronic Device 电子器件可靠性
This paper points out that shot noise and traps are related, and predicts the applications of shot noise in the device reliability characterization.
本文指出器件中散粒噪声和内部缺陷是相关的,并预测了散粒噪声在器件可靠性表征中的应用。
参考来源 - 电子元器件散粒噪声特性及测试方法研究·2,447,543篇论文数据,部分数据来源于NoteExpress
These components must be located as close to the device as possible to minimize supply overshoot and maximize device reliability.
这些元件必须尽可能靠近TA2020,以尽量减少过冲且尽量保证IC的可靠性。
The device reliability techniques are investigated from the points of space environments and radiation tolerance of satellite-carried computer.
从空间环境与星载计算机抗辐射角度研究星载计算机器件级可靠性技术。
With the rapid scaling down of MOS devices, the direct tunneling current becomes the main factor for MOS device reliability instead of FN tunneling.
随着器件尺寸的迅速减小,直接隧穿电流将代替FN电流而成为影响器件可靠性的主要因素。
应用推荐