A plan of Design For Test based of Boundary Scan testing is introduced for this signal processing system.
接着，提出了该信号处理系统基于边界扫描的可测性设计方案。
参考来源 - 基于多DSP的相控阵雷达高速实时信号处理系统的设计与开发Design for test(DFF) is an important testing technique addressing these challenges.
因此，无论是测试手段还是可测试设计，深亚微米技术都对它们提出了更为严峻的挑战。
参考来源 - 高清晰度电视ATSC·2,447,543篇论文数据，部分数据来源于NoteExpress
The design of chip test controller of a security chip and design for test of corresponding cores are discussed in detail.
从可测性设计角度讨论了信息安全处理芯片的芯片级测试控制器的设计以及相应核的可测性设计。
Understand design constraints such as design for cost, design for manufacturability and producibility, design for test, design for maintainability, etc.
理解设计限制，如成本设计、制造能力和生产能力设计、检验设计、维护设计等。
Design for test is an important process in the chip design nowadays, testability design of wireless chip needs a much higher requirement of test technology.
可测试性设计是现代芯片设计中的关键环节，针对无线接入芯片的可测试性设计对测试技术有更高的要求。
应用推荐