The depth resolution in resonant depth profiling is seriously affected by the resonant width, energy straggling etc.
在利用共振核反应测元素浓度的深度分布时,共振宽度和能量歧离等严重影响测量的精度。
The depth resolution of reconstructed image was enhanced by one order of magnitude and the image became sharper and cleaner.
重建后的膜层结构图像的深度分辨率提高了一个数量级,图像也取得了更好的锐化、去噪的效果。
Among the destructive techniques able to provide the desired depth resolution the most widely used technique is secondary-ion-mass spectroscopy (SIMS).
在可以提供所希望的纵向分辨率的损伤技术中,最广泛运用的是二次离子质谱(SIMS)。
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