Depth profile analysis and comparison of samples are separately conducted by three sets of SIMS instruments and main parameters of samples used for calibration are calibrated.

分别用三台SIMS仪器对样品进行了深度剖析与比对，并对用作校准目的的样品主要参数进行了定值。

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Discharge conditions at which depth profile analysis of tinplate had good depth resolution were selected by researching spectrometric behaviors of tinplate at different discharge conditions.

通过研究不同放电条件下镀锡钢板的光谱行为，确定了具有较好深度分辨率的放电条件，建立了镀锡钢板的辉光放电发射光谱定量深度分析方法。

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And the depth profile resolution of interface analysis is determined by compromise between the ion mixing and pile up effect.

深度剖面分析的分辨率由离子混合效应和原子堆积效应的折衷结果而决定。

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