The test generation algorithm for non-robust path delay fault in combinational circuits is studied.

研究了组合电路中非鲁棒性路径时滞故障的测试生成算法。

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The experiments indicate that functional test sets may be able to identify functions whose realizations have low path delay fault coverage.

实验表明，这种功能测试集具有实现低路径延迟故障覆盖范围的功能。

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This paper proposes a new algorithm for transient current test (IDDT) generation for delay fault.

这里提出了一种关于延时故障的测试产生算法。

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