functionally integrated defect analysis system 功能性整体故障分析系统
The invention relates to a defect analysis method for semiconductor integrated circuit devices and a defect analysis system.
本申请涉及用于半导体集成电路设备的缺陷分析方法和缺陷分析系统。
Weld defects classification system based on fuzzy reasoning model was established, after analysis of weld defect features in X-ray films.
分析工业X射线底片焊缝缺陷特征，建立用于焊缝缺陷分类识别的模糊推理系统模型。
A knowledge_based intelligent expert system of defect analysis of navigational aluminum_magnesium casting is developed by using artificial intelligence technology.
采用人工智能技术，建立了一个基于知识的航空铝镁铸件缺陷分析智能专家系统。
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