Due to the continuous increase in chip complexity and transistor density, the cost of testing the chips will approach and even exceed the cost of design and manufacturing them.
如果按照目前的发展趋势,测试成本将有可能超过芯片自身的设计和制造成本。
参考来源 - SoC低成本测试技术与实现方法研究·2,447,543篇论文数据,部分数据来源于NoteExpress
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