Aiming at the problem of testing parametric fault in analog integrated circuits, an approach based on power spectrum correlation analysis for diagnosing parametric faults is presented.
针对模拟集成电路参数型故障的测试难题，提出了定位模拟集成电路参数型故障的功率谱相关分析方法。
The correlation between the standard classified road power spectral density (PSD) and international roughness index (IRI) was discussed by using regressive analysis.
通过回归分析的方法对标准分级道路功率谱密度与相应国际平整度指数之间的关系进行了研究。
The example shows that it is feasible that the theories of grey correlation and regression analysis is used for social power consumption.
实例表明，灰色关联和回归分析理论应用于社会用电量预测是可行的。
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