Correction factors of application environment are figured out.
计算出真空计应用环境下的校正系数。
Correction factors to the resistivity calculation may be required for extremely thin or thick samples.
对于极薄或极厚的样品，可能需要使用修正因数对电阻率的计算进行修正。
The correction factors based on the unilayer step-junction theory are calculated using an electrical computer.
基于单层突变结理论，使用计算机计算了修正因子。
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