non-contact scanning detector 非接触式扫描跟踪器 ; 非接触式扫描检测器
contact scanning detector 非接触式扫描检测器
contact scanning machine 接触式扫查机
automatic contact scanning 自动接触式扫描
body-contact scanning 接触式扫描机构
contact scanning technology 接触式扫描测量
conventional contact scanning 常规接触式扫描
non contact scanning detector 非接触式扫描跟踪器
The FLIR B660 infrared camera uses an advanced, highly-sensitive detector for non-contact scanning across wide areas.
B660的前视红外红外摄像机采用先进的，高度敏感探测器的非接触式扫描的广泛领域。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Glasses and contact lenses do not interfere with the scanning process, and it takes only a brief moment.
一般眼镜与隐形眼镜都不会干扰扫描过程，而且仅需短暂的时间。
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