A new test data compression technique based on encoding series and alternation sequences is proposed.

提出一种新的基于连续和交替序列编码的测试数据压缩方案。

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To reduce the storage volume of the test data during the built-in self-test (BIST), a new BIST technique based on two dimensional compression of test data is presented.

为压缩内建自测试(BIST)期间所需测试数据存储容量，提出了一种新的基于测试数据两维压缩的BIST方案。

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For the test application time can be reduced effectively, this paper proposes an approach based on scan chain disabling technique, in view of incompatible test vector compression method.

为进一步降低测试功耗及测试应用时间，提出一种基于扫描链阻塞技术且针对非相容测试向量的压缩方法。

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