Built-in test (BIT) technique is a suit of necessary equipment of the complicated electronic system.
机内测试(BIT)技术是复杂电子系统的必需设备。
Aiming at developing problem of test system for circuit board for large scale and complicated electronic equipment, the open model was presented.
针对大型复杂电子装备电路板测试系统的开发问题,提出了一种开放式开发模式。
Report forms in Electronic affair system are complicated, not easy to realize.
电子政务系统中各种统计报表纷繁复杂,实现起来比较麻烦。
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