An iterated algorithm to count the code distance distribution is derived.

给出了一种计算同步变长码码距分布的迭代算法。

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It is found that the error resiliency of SVLC is related with its code distance distribution.

分析发现同步变长码的抗误码扩散概率与其码距分布有关。

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The polarities check ability, minimum code distance and capacity of correct single bit error of CRC-CCITT are proved by using galois field polynomial theory.

以国际标准CRC-CCITT循环冗余校验码为研究对象，利用近世代数多项式理论证明其奇偶校验性质、最小码距和纠正单比特错误能力。

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