When the length of CMP is great larger then the depth of the reflector, the information included in the Time-Distance curve can be used to get the anisotropy parameters of the ti media.
当道集的排列长度远大于勘探目的层的深度时，P波走时资料包含的信息可以用来确定TI介质的各向异性参数。
The invention can be used in electricity for measuring whether the interlayer media of the copper leading wires are eroded after the CMP process of the copper leading wires.
本发明可以用于电学测量铜引线在CMP过 程后铜引线层间介质是否产生侵蚀现象。
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