The high-voltage CMOS devices can be used in high-voltage integrated circuit(HV-IC) such as driver ICs for PDP and FED.

高压CMOS器件的研制可为进一步研制FED和PDP平板显示高压驱动电路奠定基础。

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Testing based on stuck-at fault model is insufficient for high performance ICs, especially for CMOS circuits.

基于固定型故障模型的测试方法已不能满足高性能集成电路，尤其是对CMOS电路的测试要求。

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