This paper discussed several classical fault diagnostic algorithms for memories based on some fault models.
文中从存储器的故障模型入手,着重描述了存储器常见的诊断算法。
At the same time, the classical fault-tolerant techniques are all proven to be too costly to be used in non-critical applications.
同时,经典的容错技术都被证明是太贵,可用于非关键应用。
Based on the specific diagnostic cases of impact-rub fault, the limitation of classical linear method and the advantage of multidimensional method are analyzed by comparison.
通过具体的碰摩故障诊断实例,对比分析了经典线性方法的局限和多尺度非线性方法的优势。
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