The digital logic chip of the invention and the method of design for testing can realize the observation of circuit scanning test by adopting few pins.
本发明的数字逻辑芯片及其可测试设计的方法，能够通过少量管脚实现电路在扫描测试时的可观测。
The design method of LED big screen scanning circuit is introduced, and the virtues of programmable logic device application on high-speed digital system are presented.
介绍了LED大屏幕扫描电路的设计方法，阐述了可编程逻辑器件在高速数字系统应用中的优点。
The apparatus mainly consists of a high temperature environmental chamber, a power circuit of heating, two high-speed pyrometers , and a laser scanning system.
测量装置主要包括高温环境实验箱、加热供电回路、两套高速高温计及一套激光扫描系统构成。
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