The lateral distribution of injected charges can be measured precisely using the charge pumping method.
利用电荷泵方法可以有效而准确地测量出注入电荷沿沟道方向的分布。
A method is presented for measuring the minority recombination Lifetime in MOS fet's by charge pumping effect.
本文介绍了应用电荷抽取效应测量MOS晶体管中少子复合寿命的方法。
The power efficiency of MOS charge pumping circuit is becoming one of the most important issues as the power supply decreasing continuously and the area of a chip.
随着电源电压的不断降低和芯片面积的不断减小,电荷泵的效率已成为MOS电荷泵电路设计过程中最为人们关心的问题之一。
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