... bulk resonance体积共振 bulk scattering体积散射 bulk strain体积应变 ...
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bulk material scattering 块料散射 ; 整块材料散射
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A detection method for obtaining the micro bulk defect size in semiconductive materials by analyzing near infrared laser scattering light distribution is presented.
提出了利用近红外激光散射光强分布分析来检测半导体材料内部微体缺陷的检测方法。
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