注意：基于 MCI 体系结构的旧系统在这个步骤之前还将执行一个附加的步骤，即所谓的内建自检（Built In Self Test，BIST）。对于基于 PCI 体系结构的系统，不再需要执行这个步骤。
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built-in self test 内置自测试 ; 内建自我测试 ; 内建自测
Automatic Built-In Self-Test 自动化内置自测试
Built-In Self-Test 内建自我测试
logic built in self test 逻辑内建自测试
memory built-in self-test 存储器内建自测试
Built In-Self Test 自我测试电路
BIST Built-in Self Test 机内自我测试
Built-in Self-Test Architecture 内建自我测试的结构
BIST Built In Self Test 内置自测试
This method can be applied to the built in self test of equipment and accomplish on line fault detection of period signals.
该方法可应用到设备内部自测试中，并可完成周期信号的在线故障检测。
Built-In self test: An electrical testing method that allows the tested devices to test itself with specific added-on hardware.
嵌入式自测试：一种在特别添加的硬件中允许被测元件自我测试的电子测试方法。
To reduce the storage volume of the test data during the built-in self-test (BIST), a new BIST technique based on two dimensional compression of test data is presented.
为压缩内建自测试(BIST)期间所需测试数据存储容量，提出了一种新的基于测试数据两维压缩的BIST方案。
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