SRAM BIST is also combined with ARM core's boundary scan testing during system level DFT.

系统级可测性设计主要是将存储器BIST与ARM核的边界扫描测试相结合。

youdao

As a standard technique of test and Design-For-Testability for testing the digital printed circuit board, Boundary-Scan technique has obtained widespread application in electronic equipment.

边界扫描技术是一种标准的数字电路测试及可测试性设计方法，它在工业界得到了广泛的应用。

youdao

With the continual improvement of the chip's integration level and complexity of print circuit board, the application of boundary scan test technology becomes wider and wider in testing ICs.

随着芯片集成度和印刷电路板复杂度的不断提高，边界扫描测试技术在芯片故障检测中的应用越来越广泛。

youdao