Probes with different beam angles can be used to detect planar defects at varying angles of orientation.

不同光束角度的探头可用于检测不同方向角度的平面缺陷。

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Because the beam formed by a tapered coupler is produced by many rays that emerge at slightly different angles, the outgoing beam is characterized by a relatively large divergence.

因为尖劈耦合器形成的光束是由许多出射角稍有不同的光线组成的，放出射光束的特点是具有较大的发散度。

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Ion beam etching (IBE) was applied to treat the as-polished surfaces of a CLBO crystal with varying in rotation speed of clamp, etching times and incidence angles.

本文研究了在不同作用时间、不同工件转速、不同入射角度等条件下离子束对CLBO晶体抛光表面的处理效果。

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