We use spreading Resistance technique to test and analyze silicon and silica base materials. This technique is more suitable to control material quality and develop new materials.
本文利用扩展电阻技术对半导体硅、硅基材料进行测试分析，从而用以开发新材料和评估材料的质量。
By analyzing land use maps, combining statistic materials, connect the spatial data and attribute data and build dynamic change data base of land use.
通过对土地利用图的空间分析，结合统计资料，将属性数据和空间数据链接，建立起区域土地利用动态变化数据库。
Qualitative comparison of wear resistance between sintered iron base materials in common use has been made with the aims of providing reference for reasonable selection of various materials available.
对部分常用烧结铁基材料的耐磨性进行了定性比较，为合理选用现有各种材料提供了参考。
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