• 裸芯片 - 引用次数：1

  The new method improve the accuracy of the junction temperature measurement. Finally,we we has completed the burn-in screening power bare chip through the peak value junction temperature method and carried on the validity check through the probe test.

  最后,通过峰值结温法完成了老化筛选功率裸芯片,并通过探针测试对试验结果进行了验证。

  参考来源 - 功率裸芯片的测试与老化筛选技术
  裸片

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