... backscattering spectrometry 后散射能谱测定法 backscattering lidar 反散射光达 Backscattering probability 后向散射概率 ...
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Rutherford Backscattering Spectrometry 拉塞福散射光谱 ; 背散射能谱分析 ; 卢瑟福背散射
rutherford backscattering spectrometry rbs 卢瑟福背散射
ion channeling backscattering spectrometry 离子沟道背散射谱法
The distribution of rare earth ions embedded into porous silicon films was observed by Rutherford backscattering spectrometry.
用卢瑟福背散射谱分析了稀土离子在多孔硅薄膜中的分布情况。
Rutherford backscattering spectrometry (RBS) demonstrates that the concentration of Fe or N atoms varies gradually from the substrate to the surface through the whole thickness of the films.
卢瑟福背散射分析结果表明，铁、氮两种原子的密度沿膜厚度方向呈梯度变化。
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