Average wafer thickness value on basis of 100% control with an automatic inspection system.
晶片的平均厚度值以100%控制的自动检测系统的测量值为基础。
An automatic inspection system was presented according to the characteristics of the circular spinneret.
根据圆形喷丝板的特点，设计了喷丝板自动检测系统。
An automatic inspection system with high accuracy for the screen mesh is developed by suing the visual inspection technique and the automatic control technique.
文中论述了利用计算机视觉检测技术和自动控制技术实现电子网板高精度、全自动检测系统的方法。
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