The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported.
报道了对扫描探针电子能谱仪（SPEES）中俄歇电子出射的理论模拟研究。
Auger electron Spectrscopy (AES) has widespread use in determining the chemical and electronic structure of solid surface (40a).
俄歇电子谱仪广泛地利用来确定固体表面的化学和电子结构(40 A)。
The structure and chemical compositions of the surface oxide film were investigated by XRD and Auger electron spectrometry (AES).
利用X射线衍射(XRD)和俄歇电子衍射(AES)观察了表面膜的化学成分及结构。
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