Morphology of functional polysiloxane film and their orientation on fiber have been observed and studied by an atomic force probe microscope (AFM) and other instruments.
用原子力探针扫描电镜AFM等仪器对聚硅氧烷的膜形态及其排列方式作研究。
The film and its surface morphologies of amino-polysiloxane were observed and studied by means of atomic force probe microscopy(AFM) and contact angle measurement instrument.
应用原子力显微镜（AFM）和接触角测量仪对乙酸酐改性氨基聚硅氧烷的成膜性及膜形态进行了研究。
On the basis of the aiming principle of the atomic force probe a-long with 2D micro-displacement system and the high precision capacitive sensors , the micro-dimension measurement system is developed.
本文基于原子力微探针瞄准原理并结合二维微位移系统和高精度电容传感器，研制了微尺寸测量系统。
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