The thickness of absorbed films was measured for three CWM dispersants by X-rayphotoelectric spectrometer and argon-ion etching in this report.
本文采用X光电子能谱加氩离子刻蚀法，测出三种分散剂在煤表面吸附膜的近似厚度。
我们可以用氩离子。
In ion beam milling technique, ordinarily, the argon ion is used as the ion source.
离子束研磨减薄技术中，目前常用的是氩离子。
应用推荐