A simple method for area measurement of irregular plane object using area array CCD was presented.
文中介绍了利用面阵CCD测量不规则平面物体面积的原理和方法。
An instrument based on area array CCD devices for measuring stresses in semiconductor materials is studied and realized.
研究和实现了采用面阵CCD器件的半导体材料应力测试仪。
Therefore area array CCD is adopted for the non-contact measurement of the diameter of the abrading section of the drill pipe.
鉴于此，采用面阵CCD对钻杆受磨损部位的直径进行非接触式测量。
应用推荐