The gases absorbed on the surface of SiC particles are analyzed with the quadripole mass analyzer.
用四极质量分析仪对碳化硅颗粒表面吸收的气体进行了分析，获得了碳化硅颗粒的表面化学成分。
An implanter without ion mass analyzer was used to fabricate thin SOI materials by low energy and low dose water ions implantation instead of conventional SIMOX.
采用无质量分析器的离子注入机，以低能量低剂量注水的方式代替常规SIMOX注氧制备soi材料。
The high resolution energy achromatic system consists of an electrostatic analyzer and a magnetic analyzer, which mass resolution can reach 600 and transmission is better than 80%.
静电分析器和磁分析器构成能量消色散系统，质量分辨率可达600以上，传输效率好于80%。
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