TMap features several techniques, including test strategy development, test point analysis, the testability review of the test basis, and many test specification techniques and checklists.
TMap有多个技术特性，包括测试策略开发、测试点分析、测试的易测性复审和许多测试规格说明技术和检查单。
A partial scan algorithm for BIST, which combines the structure analysis and testability analysis, is presented in this paper.
提出了一种在内建自测试(BIST)中进行部分扫描的算法，此算法综合了电路的结构分析和可测性分析。
An evaluation method fur failure sample set based on fuzzy grey relation analysis is proposed in order to obtain perfect failure sample set before testability demonstration experiment.
为了在测试性验证试验之前获得理想的故障样本集，提出了一种基于模糊灰色关联分析的故障样本评估方法。
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